Shiva Taghipour

发表

Aging comparative analysis of high-performance FinFET and CMOS flip-flops

Rahebeh Niaraki Asli, Shiva Taghipour, 2017, Microelectron. Reliab..

Low Complexity Converter for the Moduli Set {2^n+1,2^n-1,2^n} in Two-Part Residue Number System

Shiva Taghipour, 2019 .

Reliable and high performance asymmetric FinFET SRAM cell using back-gate control

Rahebeh Niaraki Asli, Shiva Taghipour, R. N. Asli, 2020 .

Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops

Rahebeh Niaraki Asli, Shiva Taghipour, 2019, J. Electron. Test..

MOCA ARM: Analog Reliability Measurement based on Monte Carlo Analysis

Rahebeh Niaraki Asli, Shiva Taghipour, 2016 .

A Near-Threshold Soft Error Resilient 7T SRAM Cell with Low Read Time for 20 nm FinFET Technology

Rahebeh Niaraki Asli, Shiva Taghipour, 2017, J. Electron. Test..