Alexander Czutro

发表

Bernd Becker, Matthias Sauer, J. Jiang, 2012, 2012 IEEE 21st Asian Test Symposium.
Bernd Becker, Matthias Sauer, Ilia Polian, 2012, 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Bernd Becker, Sandip Kundu, Ilia Polian, 2007, IEEE Design & Test of Computers.
Sudhakar M. Reddy, Bernd Becker, Ilia Polian, 2014, 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems.
Sudhakar M. Reddy, Bernd Becker, Piet Engelke, 2009, 2009 22nd International Conference on VLSI Design.
Bernd Becker, Mariane Comte, Michel Renovell, 2008, 2008 13th European Test Symposium.
Bernd Becker, Matthias Sauer, Ilia Polian, 2011, 2011 Asian Test Symposium.
Bernd Becker, Mariane Comte, Michel Renovell, 2009, 2009 27th IEEE VLSI Test Symposium.
Bernd Becker, Matthias Sauer, Ilia Polian, 2012, 2012 17th IEEE European Test Symposium (ETS).
Sudhakar M. Reddy, Bernd Becker, Piet Engelke, 2009, 2009 Asian Test Symposium.
Sudhakar M. Reddy, Bernd Becker, Piet Engelke, 2009, 2009 22nd International Conference on VLSI Design.
Bernd Becker, Matthias Sauer, Ilia Polian, 2014, 2014 19th IEEE European Test Symposium (ETS).
Bernd Becker, Matthias Sauer, Ilia Polian, 2012, 2012 17th IEEE European Test Symposium (ETS).
Bernd Becker, Matthias Sauer, Ilia Polian, 2011, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Bernd Becker, Ilia Polian, Sybille Hellebrand, 2009, 2009 15th IEEE International On-Line Testing Symposium.
Bernd Becker, Sandip Kundu, Ilia Polian, 2006, 2006 International Conference on Computer Design.
Bernd Becker, Ilia Polian, Alexander Czutro, 2005, Design, Automation and Test in Europe.
Bernd Becker, Matthias Sauer, Ilia Polian, 2011, 2011 IEEE 17th International On-Line Testing Symposium.
Sudhakar M. Reddy, Bernd Becker, Matthias Sauer, 2012, 2012 25th International Conference on VLSI Design.
Bernd Becker, Matthias Sauer, Ilia Polian, 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Bernd Becker, Matthias Sauer, Ilia Polian, 2013, IEEE Design & Test.
Sudhakar M. Reddy, Bernd Becker, Matthias Sauer, 2012, 2012 IEEE International Test Conference.
Bernd Becker, Matthias Sauer, Ilia Polian, 2012, 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
Bernd Becker, Matthias Sauer, Ilia Polian, 2012, 2012 IEEE 30th VLSI Test Symposium (VTS).