Abdullah Mumtaz

Variation-Aware Fault Grading

Bernd Becker, Matthias Sauer, J. Jiang, 2012, 2012 IEEE 21st Asian Test Symposium.

Embedded Test for Highly Accurate Defect Localization

Hans-Joachim Wunderlich, Michael E. Imhof, Abdullah Mumtaz, 2011, 2011 Asian Test Symposium.

Variation-aware deterministic ATPG

Bernd Becker, Matthias Sauer, Ilia Polian, 2014, 2014 19th IEEE European Test Symposium (ETS).

P-PET: Partial pseudo-exhaustive test for high defect coverage

Hans-Joachim Wunderlich, Michael E. Imhof, Abdullah Mumtaz, 2011, 2011 IEEE International Test Conference.

Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test

Hans-Joachim Wunderlich, Sybille Hellebrand, Michael E. Imhof, 2012, 2012 13th Latin American Test Workshop (LATW).