L. Baron

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip

Jean Michel Portal, Pascal Masson, T. Kempf, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Determining the minimum clamping force by cutting force simulation in aerospace fuselage pocket machining

L. Baron, A. Mahmud, J. R. R Mayer, 2015 .