Kazuyuki Morimoto

Failure analysis using the infrared optical-beam-induced resistance-CHange (IR-OBIRCH) method : Technologies supporting semiconductor scientific manufacturing : Process monitoring, testing, failure analysis and reliability

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, 2000 .

Failure analysis case studies using the IR-OBIRCH (infrared optical beam induced resistance change) method

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, 1999, Asian Test Symposium.