Chwan-Ying Lee
发表
John Yeh,
John Chern,
Hwann-Kaeo Chiou,
2008
.
Chwan-Ying Lee,
Kwang-Lung Lin,
Kwang-Lung Lin,
1994
.
Negative bias temperature instability of SiC MOSFET induced by interface trap assisted hole trapping
Cheng-Tyng Yen,
Chien-Chung Hung,
Lurng-Shehng Lee,
2016
.