Shigehiko Hasegawa

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

Kenji Hosogi, Hajime Sasaki, Naohito Yoshida, 2009, Microelectron. Reliab..

Fuzzy Modeling Using Genetic Algorithm with Adaptive Mutation Operator

Makoto Ohki, Masaaki Ohkita, Shigehiko Hasegawa, 1999 .

Polycrystalline GaN for light emitter and field electron emitter applications

Shigehiko Hasegawa, Hajime Asahi, S. Nishida, 2005 .

Electron field emission from GaN nanorod films grown on Si substrates with native silicon oxides

Shigehiko Hasegawa, Hajime Asahi, S. Nishida, 2005 .

Low temperature molecular beam epitaxy growth of cubic GaCrN

Y. Yamauchi, Shigehiko Hasegawa, Hajime Asahi, 2008 .