Ming-Tsan Lee

High performance 50 nm CMOS devices for microprocessor and embedded processor core applications

Wei Jin, Jia Chen, C. Wann, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

Integration of high-performance, low-leakage and mixed signal features into a 100 nm CMOS technology

G. Knoblinger, Yi-Hsiung Lin, C. Wann, 2002, 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).