C. Hatchard

Developing a transient induced latch-up standard for testing integrated circuits

T. Meuse, L.G. Henry, J. Barth, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).

Alternative test methods for RF immunity testing

C. Hatchard, M. Hopkins, 1995, 1995 International Conference on Electromagnetic Interference and Compatibility (INCEMIC).

Transient latch-up using an improved bi-polar trigger

C. Hatchard, I. Morgan, M. Mahanpour, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).