M. G. Valentini
发表
L. Pantisano,
A. Paccagnella,
P. Colombo,
1999,
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).
L. Pantisano,
A. Paccagnella,
Giorgio Cellere,
2001
.
A. Paccagnella,
Giorgio Cellere,
M. G. Valentini,
2002,
7th International Symposium on Plasma- and Process-Induced Damage.
Alessandro Paccagnella,
Giorgio Cellere,
M. G. Valentini,
2002
.
Alessandro Paccagnella,
L. Pantisano,
O. Flament,
2000,
2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479).
Alessandro Paccagnella,
L. Pantisano,
Paolo Colombo,
2000
.
A. Paccagnella,
Luca Larcher,
Giorgio Cellere,
2002
.
L. Pantisano,
P. Colombo,
M. G. Valentini,
1999,
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395).
A. Paccagnella,
Luca Larcher,
Giorgio Cellere,
2002
.
Alessandro Paccagnella,
L. Pantisano,
Giorgio Cellere,
2002
.
M. G. Valentini,
A. Paccagnella,
G. Cellere,
2001,
2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538).
M. G. Valentini,
A. Paccagnella,
A. Moro,
2003,
2003 8th International Symposium Plasma- and Process-Induced Damage..
M. G. Valentini,
A. Paccagnella,
G. Cellere,
2005,
IEEE Transactions on Electron Devices.
Chandra Mouli,
A. Ghetti,
M. G. Valentini,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
L. Pantisano,
A. Paccagnella,
G. Cellere,
2003,
IEEE Electron Device Letters.
A. Paccagnella,
G. Cellere,
M.G. Valentini,
2004,
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866).