E. Franke

Spectral purity requirements for UHF LOS/SATCOM transmitters

E. Franke, P. Benton, 1995, Proceedings of MILCOM '95.

Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry

Mathias Schubert, John A. Woollam, Frank Frost, 2000 .

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

Mathias Schubert, John A. Woollam, Michael J. DeVries, 2001 .

Infrared switching electrochromic devices based on tungsten oxide

Mathias Schubert, John A. Woollam, E. Franke, 2000 .

In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures

Mathias Schubert, John A. Woollam, Daniel W. Thompson, 1998 .

Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range

Mathias Schubert, John A. Woollam, Daniel W. Thompson, 1997 .