Kriti Kohli

Novel in-line metrology methods for Fin pitch walking monitoring in 14nm node and beyond

Todd C. Bailey, Yunlin Zhang, Robin Chao, 2014, Advanced Lithography.

Multitechnique metrology methods for evaluating pitch walking in 14 nm and beyond FinFETs

Todd C. Bailey, Yunlin Zhang, Gangadhara Raja Muthinti, 2014 .

Team 9: A Comparison of Simple vs. Complex Models for Suicide Risk Assessment

Kriti Kohli, Michelle Morales, Prajjalita Dey, 2021, CLPSYCH.