Lena Nicolaides

High-resolution in-die metrology using beam profile reflectometry and ellipsometry

Jon Opsal, Chung-sam Jun, Heath Pois, 2007, SPIE Advanced Lithography.

Optical property determination of turbid media using frequency-domain infrared photothermal radiometry

Yan Chen, Andreas Mandelis, I. Alex Vitkin, 2000, BiOS.

Laser infrared photothermal radiometric depth profilometry of steels and its potential in rail track evaluation

Andreas Mandelis, Lena Nicolaides, A. Mandelis, 1999 .

Image-enhanced thermal-wave slice diffraction tomography with numerically simulated reconstructions

Andreas Mandelis, Lena Nicolaides, 1997 .

Structure and the Reflectionless/Refractionless Nature of Parabolic Diffusion-Wave Fields

Andreas Mandelis, Lena Nicolaides, A. Mandelis, 2001 .

An adaptive multiscale inverse scattering approach to photothermal depth profilometry

Eric L. Miller, Ibrahim Yavuz, Andreas Mandelis, 2000 .

Nonlinear inverse scattering methods for thermal-wave slice tomography: a wavelet domain approach

Eric L. Miller, Andreas Mandelis, Lena Nicolaides, 1998 .