P. Juliano

发表

Accurate wafer-level measurement of ESD protection device turn-on using a modified very fast transmission-line pulse system

Elyse Rosenbaum, P. Juliano, 2001 .

Silicon germanium heterojunction bipolar transistor electrostatic discharge power clamps and the Johnson limit in RF bicmos SiGe technology

P. Juliano, Steven H. Voldman, Louis D. Lanzerotti, 2002 .

Reliability-Driven CAD System for Deep-Submicron VLSI Circuits

Elyse Rosenbaum, Tong Li, P. Juliano, 1998 .

Electrothermal modeling of ESD diodes in bulk-Si and SOI technologies

Yu Wang, P. Juliano, E. Rosenbaum, 2000, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).

ESD protection for BiCMOS circuits

Sung-Mo Kang, Elyse Rosenbaum, P. Juliano, 2000, Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124).

ESD robustness of a BiCMOS SiGe technology

James S. Dunn, Bernard S. Meyerson, David L. Harame, 2000, Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124).