Myung Kwan Cho

High performance SONOS memory cells free of drain turn-on and over-erase: compatibility issue with current flash technology

Myung Kwan Cho, D.M. Kim, 2000, IEEE Electron Device Letters.

Simultaneous hot-hole injection at drain and source for efficient erase and excellent endurance in SONOS flash EEPROM cells

D.M. Kim, Myung Kwan Cho, 2003, IEEE Electron Device Letters.