Joan Figueras

I/sub DDQ/ characterization in submicron CMOS

Antoni Ferré, Joan Figueras, 1997, Proceedings International Test Conference 1997.

M-S test based on specification validation using octrees in the measure space

Álvaro Gómez-Pau, Luz Balado, Joan Figueras, 2013, 2013 18th IEEE European Test Symposium (ETS).

Diagnosis of Full Open Defects in Interconnecting Lines

Camelia Hora, Bram Kruseman, Ananta K. Majhi, 2007, 25th IEEE VLSI Test Symposium (VTS'07).

Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments

Josep Rius Vázquez, Joan Figueras, 1996, J. Electron. Test..

Detecting I/sub DDQ/ defective CMOS circuits by depowering

Josep Rius Vázquez, Joan Figueras, 1995, Proceedings 13th IEEE VLSI Test Symposium.

IS-FPGA : a new symmetric FPGA architecture with implicit scan

Yervant Zorian, Michel Renovell, Jean Michel Portal, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).