F. Liu

Rigorous extraction of process variations for 65nm CMOS design

Yu Cao, D. Acharyya, Wei Zhao, 2007, ESSDERC 2007 - 37th European Solid State Device Research Conference.

A heuristic to determine low leakage sleep state vectors for CMOS combinational circuits

F. Liu, R. Rao, Richard B. Brown, 2003, ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486).

Compact modeling of stress effects in scaled CMOS

Yu Cao, Chi-Chao Wang, Wei Zhao, 2009, 2009 International Conference on Simulation of Semiconductor Processes and Devices.

Rapid Characterization of Threshold Voltage Fluctuation in MOS Devices

K. Agarwal, K. Nowka, S. Nassif, 2007, 2007 IEEE International Conference on Microelectronic Test Structures.