P. X. Wang

Analysis of SET Propagation in a System in Package Point of Load Converter

V. Pouget, Frédéric Saigné, Jerome Boch, 2019, IEEE Transactions on Nuclear Science.

SEE Tests of the NAND Flash Radiation Tolerant Intelligent Memory Stack

S. Gerardin, M. Bagatin, A. Paccagnella, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).