J. T. Watt

发表

Zhiping Yu, Tao Chen, Robert W. Dutton, 1995, 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers.

Layout-based extraction of IC electrical behavior models

Zhiping Yu, Ronald W. Knepper, Tao Chen, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.

The effect of interconnection resistance on the performance enhancement of liquid-nitrogen-cooled CMOS circuits

James D. Plummer, J. T. Watt, J. Plummer, 1989 .

Characterization of surface mobility in MOS structures containing interfacial cesium ions

James D. Plummer, J. T. Watt, Bruce J. Fishbein, 1989 .

Dispersion of MOS capacitance-voltage characteristics resulting from the random channel dopant ion distribution

James D. Plummer, J. T. Watt, J. Plummer, 1994 .