Cora Salm

发表

Towards understanding recovery of hot-carrier induced degradation

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz, 2018, Microelectron. Reliab..

Optimisation of a solar cell. Exercise in simulation based training, using the MODEM telelearning concept

A. J. Mouthaan, Cora Salm, Jan Hensgens, 1998 .

Test chip for detecting thin film cracking induced by fast temperature cycling and electromigration in multilevel interconnect systems

A. J. Mouthaan, Cora Salm, Fred G. Kuper, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

Charging induced damage on complex-antenna test structures

Cora Salm, J. Ackaert, Fred G. Kuper, 2001 .

Low-frequency noise in hot-carrier degraded nMOSFETs

Cora Salm, Jurriaan Schmitz, Eric Hoekstra, 2007, Microelectron. Reliab..

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Simulation of the reservoir effect of different lay outs in multilayer metallisation film

A. J. Mouthaan, Cora Salm, Fred G. Kuper, 2000 .

Spring-constant measurement methods for RF-MEMS capacitive switches

Jiahui Wang, Cora Salm, Jurriaan Schmitz, 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS).

Nanoelectronic-microelectronic interfacing

Bram Nauta, Cora Salm, Jurriaan Schmitz, 2005 .

Adapting to a changing highschool population

Ferdinand van der Heijden, Cora Salm, Mathieu Odijk, 2010 .

Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect

Zhichun Wang, Cora Salm, Jan Ackaert, 2004, Microelectron. Reliab..

Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2003 .

Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs

Cora Salm, Jurriaan Schmitz, Fred G. Kuper, 2006, Microelectron. Reliab..

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz, 2017, Microelectron. Reliab..

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2003, Microelectron. Reliab..

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2002, Microelectron. Reliab..

Impact of layout and technology variation on the CDM performance of ggNMOSTs and SCRs

A. J. Mouthaan, Theo Smedes, Cora Salm, 2002 .

Low-Frequency Noise Phenomena in Switched MOSFETs

Eric A. M. Klumperink, Bram Nauta, Cora Salm, 2007, IEEE Journal of Solid-State Circuits.

Full chip model of CMOS Integrated Circuits under Charged Device Model stress

Theo Smedes, Cora Salm, Fred G. Kuper, 2004 .

Optimisation of a Solar Cell

Cora Salm, Jan Hensgens, Ton J. Mouthaan, 1998 .

Microelectronics education : proceedings of the 2nd European Workshop held in Noordwijkerhout, The Netherlands, 14-15 May 1998

Cora Salm, Ton J. Mouthaan, 1998 .

Metal contacts to lowly doped Si and ultra thin SOI

Cora Salm, Jurriaan Schmitz, B. Rajasekharan, 2009 .

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime

A. J. Mouthaan, Cora Salm, R. Wenzel, 2002, Microelectron. Reliab..

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip

Cora Salm, Jurriaan Schmitz, Joost Melai, 2008, Microelectron. Reliab..

Actual Interconnect Issues and Solutions in ULSI Circuits

A. J. Mouthaan, Cora Salm, J. Holleman, 1999 .

Who wants to live forever? Physical Failure Mechanisms that Limit the Life-time of Electronic Components

Cora Salm, A. R. Merticaru, Van Hieu Nguyen, 2001 .

A 3-D Circuit Model to evaluate CDM performance of ICs

Theo Smedes, Cora Salm, Ton J. Mouthaan, 2005, Microelectron. Reliab..

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling

A. J. Mouthaan, Cora Salm, Benno Krabbenborg, 2002, Microelectron. Reliab..

The electrical conduction and dielectric strength of SU-8

Cora Salm, Jurriaan Schmitz, Jan L. Visschers, 2009 .

High-performance deep submicron CMOS technologies with polycrystalline-SiGe gates

Cora Salm, Jurriaan Schmitz, Pierre H. Woerlee, 2000 .

Deep reactive ion etching of in situ boron doped LPCVD Ge0.7Si0.3 using SF6 and O2 plasma

Cora Salm, Jurriaan Schmitz, J. Schmitz, 2013 .

Doping dependence of low-frequency noise in polycrystalline SiGe film resistors

Cora Salm, Xuyuan Chen, C. Salm, 1999 .

Spark protection layers for CMOS pixel anode chips in MPGDs

Cora Salm, Jurriaan Schmitz, E. Delagnes, 2011 .

Simulations of Reservoir Effect in Multilevel Al-Based Metallisation

A. J. Mouthaan, Cora Salm, Fred G. Kuper, 2000 .

Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects

A. J. Mouthaan, Wim Schoenmaker, Cora Salm, 1998 .

A Reliability Model for interlayer dielectrics cracking during very fast thermal cycling

A. J. Mouthaan, Cora Salm, Fred G. Kuper, 2003 .

Reduction of 1/f Noise by Switched Biasing: An Overview

Eric A. M. Klumperink, Bram Nauta, Cora Salm, 2005 .

Effect of current crowding on electromigration lifetime investigated by simulation and experiment

Cora Salm, Van Hieu Nguyen, V. Nguyễn, 2010 .

Diffusion and electrical properties of Boron and Arsenic doped poly-Si and poly-$Ge_xSi_1-x(x~0.3)$ as gate material for sub-0.25 µm complementary metal oxide semiconductor applications

Cora Salm, Jisk Holleman, J. Holleman, 1997 .

Measurement and extraction of RTS parameters under 'Switched Biased' conditions in MOSFETS

Eric A. M. Klumperink, Bram Nauta, Cora Salm, 2003 .

Twingrid: a wafer post-processed multistage micro patterned gaseous detector

Cora Salm, Jurriaan Schmitz, Maximilien Chefdeville, 2009 .

GEMGrid: a wafer post-processed GEM-like radiation detector

Cora Salm, Jurriaan Schmitz, Maximilien Chefdeville, 2009 .

On low-frequency noise of polycrystalline GexSi1−x for sub-micron CMOS technologies

Cora Salm, Xuyuan Chen, Jarle Andre Johansen, 2001 .

An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

Cora Salm, Jurriaan Schmitz, Erik H. M. Heijne, 2006 .

Fabrication and Characterization of the Charge-Plasma Diode

Bijoy Rajasekharan, Cora Salm, Jurriaan Schmitz, 2010, IEEE Electron Device Letters.

Modelling of the reservoir effect on electromigration lifetime

Cora Salm, Ton J. Mouthaan, Fred G. Kuper, 2001, Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).

Charge amplitude distribution of the Gossip gaseous pixel detector

Cora Salm, Jurriaan Schmitz, Maximilien Chefdeville, 2007 .

Recovery after hot-carrier injection: Slow versus fast traps

Cora Salm, Jurriaan Schmitz, J. Schmitz, 2019, Microelectronics Reliability.