J. van Spaandonk

Selecting measurements to test the functional behavior of analog circuits

Tom A. M. Kevenaar, J. van Spaandonk, T. Kevenaar, 1996, J. Electron. Test..

Towards a pass/fail test method for nonlinear analog circuits

J. van Spaandonk, 1994 .

DC testing of analog integrated circuits with piecewise linear approximation and interval analysis

Domine Leenaerts, J. van Spaandonk, 1993, 1993 IEEE International Symposium on Circuits and Systems.

Application of the singular value decompisition to the testing of analog circuits based approach

J. van Spaandonk, J. V. Spaandonk, 1995 .

Iterative test-point selection for analog circuits

Tom A. M. Kevenaar, J. van Spaandonk, T. Kevenaar, 1996, Proceedings of 14th VLSI Test Symposium.