Lars-Ake Ragnarsson

Methodologies for sub-1nm EOT TDDB evaluation

Guido Groeseneken, Robin Degraeve, Philippe Roussel, 2011, 2011 International Reliability Physics Symposium.

(Invited) Replacement Metal Gate/High-k Last Technology for Aggressively Scaled Planar and FinFET-Based Devices

Naoto Horiguchi, Eddy Simoen, Anabela Veloso, 2014 .

Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession

Liesbeth Witters, Serge Biesemans, Stefan Kubicek, 2010 .

Caracterízación eléctrica de nano-mosfets en tecnología SOI

Felice Crupi, Lionel Trojman, Lars-Ake Ragnarsson, 2012 .

Reliability of SiGe channel MOS

Geert Hellings, Jerome Mitard, Liesbeth Witters, 2012 .