S. Davidson

IDDQ test results on a digital CMOS ASIC

G. Schiessler, C. Spivak, S. Davidson, 1993, Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93.

Test technology educational program TTEP 2004 overview of tutorials of VTS 2004

D. Appello, Dimitris Gizopoulos, V. D. Agrawal, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

In the Licensing Dungeon: CAD by the Minute

S. Davidson, 2000, IEEE Des. Test Comput..

The architecture of the GenTest sequential test generator

S. Davidson, T. J. Chakraborty, Robert Bencivenga, 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.

Using microcomputer graphics to display numerical model results

S. Davidson, 1985 .

Debugging using resublimated thiotimoline

S. Davidson, S. Davidson, 2001, IEEE Design & Test of Computers.

Sequential Circuit Test Generator (STG) benchmark results

S. Davidson, W.-T. Cheng, S. Davidson, 1989, IEEE International Symposium on Circuits and Systems,.