Olivier Gagliano

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology

Jean-Max Dutertre, Assia Tria, Mathieu Lisart, 2012, Microelectron. Reliab..

The Finite Element Method as applied to the calculation of the quantum efficiency in optoelectronic imaging devices

Caroline Fossati, Guillaume Demesy, Mireille Commandre, 2008, NanoScience + Engineering.

Robustness improvement of an SRAM cell against laser-induced fault injection

Jean-Max Dutertre, Assia Tria, Mathieu Lisart, 2013, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).

Microlens design for CMOS image sensor

Caroline Fossati, Mireille Commandre, Olivier Gagliano, 2005, SPIE Optical Systems Design.

Building the electrical model of the pulsed photoelectric laser stimulation of a PMOS transistor in 90nm technology

Jean-Max Dutertre, Assia Tria, Mathieu Lisart, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Finite element method as applied to the study of gratings embedded in complementary metal-oxide semiconductor image sensors

Caroline Fossati, Mireille Commandre, Frédéric Zolla, 2009 .