G. Blondel

Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode

Jean-Michel Morelle, Gerard Coquery, Richard Lallemand, 2010, Microelectron. Reliab..

Preliminary failure-mode characterization of emerging direct-lead-bonding power module. Comparison with standard wire-bonding interconnection

Philippe Baudesson, Frédéric Richardeau, Damien Risaletto, 2015, Microelectron. Reliab..