Sonia Bendhia

发表

LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing

J. Li, Jianfei Wu, Alexandre Boyer, 2013, Microelectron. Reliab..

Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits

Alexandre Boyer, Sonia Bendhia, 2014, J. Low Power Electron..

Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools

Syed Mahfuzul Aziz, Sonia Bendhia, Etienne Sicard, 2010, IEEE Transactions on Education.

Prediction of Long-term Immunity of a Phase-Locked Loop

B. Li, Alexandre Boyer, Sonia Bendhia, 2011, 2011 12th Latin American Test Workshop (LATW).

Ageing effect on electromagnetic susceptibility of a phase locked loop

B. Li, Alexandre Boyer, Sonia Bendhia, 2010, Microelectron. Reliab..

Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission

Alexandre Boyer, Sonia Bendhia, 2013, 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project

Alexandre Boyer, Sonia Bendhia, 2013, Microelectron. Reliab..

On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations

Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon, 2012, IEEE Transactions on Instrumentation and Measurement.

Electronic counterfeit detection based on the measurement of electromagnetic fingerprint

He Huang, Alexandre Boyer, Sonia Bendhia, 2015, Microelectron. Reliab..

Electro-magnetic robustness of integrated circuits: from statement to prediction

Alexandre Boyer, Sonia Bendhia, 2013, 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Effect of aging on power integrity of digital integrated circuits

Alexandre Boyer, Sonia Bendhia, 2013, 2013 14th Latin American Test Workshop - LATW.

Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs

Alexandre Boyer, Sonia Bendhia, V. Tomasevic, 2015, 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter

He Huang, Alexandre Boyer, Sonia Bendhia, 2015, Microelectron. Reliab..

IC Immunity Modeling Process Validation Using On-Chip Measurements

Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon, 2011, 2011 12th Latin American Test Workshop (LATW).

A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior

Ignacio Gil, Alexandre Boyer, Sonia Bendhia, 2011, IEICE Trans. Electron..