R. Paulsen
发表
A sensitive technique to enable technology transfer and fab matching in deep sub-micron technologies
Bin Wang,
R. Paulsen,
2007,
2007 International Symposium on Semiconductor Manufacturing.
Bin Wang,
Yanjun Ma,
A. Horch,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
C. Diorio,
C.-H. Wang,
T. Gilliland,
2004,
IEEE Transactions on Device and Materials Reliability.