Davide Appello

发表

Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, 2010, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Alessandro Paccagnella, Matteo Sonza Reorda, Paolo Rech, 2009, IEEE Transactions on Nuclear Science.
Paolo Bernardi, Riccardo Cantoro, Ernesto Sanchez, 2018, IEEE Design & Test.
Aubin Roy, Davide Appello, Stephen K. Sunter, 2002, Proceedings. International Test Conference.
Matteo Sonza Reorda, Ernesto Sánchez, Davide Appello, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).
Davide Appello, Mario Barone, Youssef Baltagi, 2011, 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
Emil Gizdarski, Davide Appello, Alessandra Fudoli, 2004, IEEE Design & Test of Computers.
Adit D. Singh, Chintan Patel, Davide Appello, 2013, 2013 18th IEEE European Test Symposium (ETS).
Luigi Carro, Fernando Morgado Dias, Irith Pomeranz, 2013, J. Electron. Test..
Davide Appello, Michael Hall, Christophe Suzor, 2009, 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
Paolo Bernardi, Ernesto Sánchez, Riccardo Cantoro, 2017, 2017 18th IEEE Latin American Test Symposium (LATS).
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, 2006, 2006 IEEE International Test Conference.
Davide Appello, M. Laurino, M. Pranzo, 2017, 2017 International Test Conference in Asia (ITC-Asia).
Paolo Bernardi, Davide Appello, Michelangelo Grosso, 2008, 2008 13th European Test Symposium.
Davide Pandini, Paolo Bernardi, Davide Appello, 2008, 2008 IEEE International Test Conference.
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, 2006, 24th IEEE VLSI Test Symposium.
Maurizio Rebaudengo, Matteo Sonza Reorda, Fulvio Corno, 2001, Proceedings 10th Asian Test Symposium.
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, 2004, J. Electron. Test..
Davide Appello, 2002, Proceedings. International Test Conference.
Paolo Bernardi, Riccardo Cantoro, Davide Appello, 2018, J. Electron. Test..
Paolo Bernardi, Matteo Sonza Reorda, Ernesto Sánchez, 2009, 2009 14th IEEE European Test Symposium.
Maurizio Rebaudengo, Matteo Sonza Reorda, Fulvio Corno, 2002, Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).
Davide Appello, 2006, 24th IEEE VLSI Test Symposium.
Maurizio Rebaudengo, Matteo Sonza Reorda, Fulvio Corno, 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).
Paolo Bernardi, Alessandro Paccagnella, Matteo Sonza Reorda, 2009, 2009 27th IEEE VLSI Test Symposium.
Kenneth M. Butler, Erik Jan Marinissen, Adit D. Singh, 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).
Paolo Bernardi, Massimo Violante, Maurizio Rebaudengo, 2003, International Test Conference, 2003. Proceedings. ITC 2003..
Said Hamdioui, Xinli Gu, Riccardo Mariani, 2013, 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS).
Davide Appello, 2007, 2007 IEEE International Test Conference.
Paolo Bernardi, Matteo Sonza Reorda, Ernesto Sánchez, 2009, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Paolo Bernardi, Alessandro Paccagnella, Matteo Sonza Reorda, 2009, 2009 15th IEEE International On-Line Testing Symposium.
Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, 2011, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Paolo Bernardi, Ernesto Sánchez, Davide Appello, 2017, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017.
Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, 2006, IEEE Design & Test of Computers.
Davide Appello, 2010, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems.
Davide Appello, 2009, 2009 International Symposium on VLSI Design, Automation and Test.
Emil Gizdarski, Davide Appello, Alessandra Fudoli, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..
Davide Appello, Daniele Li Rosi, Christophe Suzor, 2010, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Paolo Bernardi, C. Guardiani, Davide Appello, 2009, 2009 15th IEEE International On-Line Testing Symposium.
Paolo Bernardi, Ernesto Sánchez, Riccardo Cantoro, 2018, J. Low Power Electron..
Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, 2021, 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Paolo Bernardi, Davide Appello, Giorgio Pollaccia, 2021, 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).