Randall W. Potter

Cost analysis and risk assessment for metrology applications

Sudhakar M. Kudva, Randall W. Potter, 1992, Advanced Lithography.

Detecting test set hardware degradation using statistical data modelling

George W. Sturm, Randall W. Potter, R. W. Potter, 1993 .

Confidence intervals on variance components

Randall W. Potter, R. W. Potter, 1992 .