F. Carta
发表
S. Kim,
Y. Xie,
T. Masuda,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
H. L. Lung,
K. Suu,
M. BrightSky,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
F. Carta,
A. Pirondi,
2010
.
S. Ambrogio,
K. Suu,
J. Bruley,
2019,
2019 Symposium on VLSI Technology.
F. M. Lee,
M. BrightSky,
Y. Zhu,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).