Raul Cordero

Monte Carlo method for evaluation of uncertainty in topometry by using in-plane electronic speckle pattern interferometry with divergent illumination

J. A. Rayas, Amalia Martínez, Jorge Parra-Michel, 2011, Symposium on Optics in Industry.

Uncertainty evaluation of displacements measured by ESPI with divergent wavefronts

Ramon Rodriguez-Vera, Hugo J. Puga, Juan A. Rayas, 2005, Other Conferences.