H. Jaouen
发表
D. Gloria,
M. Minondo,
G. Dambrine,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
G. Morin,
D. Gloria,
H. Jaouen,
2000,
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
T. Skotnicki,
S. Barraud,
P. Dollfus,
2005,
IEEE Transactions on Electron Devices.
A. Zaka,
Y. Leblebici,
D. Rideau,
2012,
IEEE Transactions on Electron Devices.
D. Rideau,
O. Saxod,
C. Tavernier,
2010,
2010 International Conference on Microelectronic Test Structures (ICMTS).
S. Pilorget,
M. Marin,
M. Minondo,
2007,
ESSDERC 2007 - 37th European Solid State Device Research Conference.
F. Danneville,
P. Scheer,
C. Charbuillet,
2013,
IEEE Transactions on Electron Devices.
D. Rideau,
L. Ciampolini,
M. Minondo,
2006
.
F. Andrieu,
O. Weber,
D. Esseni,
2013,
2013 IEEE International Electron Devices Meeting.
A. Zaka,
Y. Leblebici,
D. Rideau,
2012,
IEEE Transactions on Electron Devices.
G. Ghibaudo,
R. Clerc,
D. Rideau,
2014,
2014 International Conference on Microelectronic Test Structures (ICMTS).
V. Senez,
G. Carnevale,
H. Jaouen,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
V. Fiori,
F. Cacho,
C. Tavernier,
2008,
EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems.
V. Fiori,
A. Juge,
C. Tavernier,
2008,
2008 2nd Electronics System-Integration Technology Conference.
T. Skotnicki,
A. Pouydebasque,
H. Jaouen,
2003,
IEEE International Electron Devices Meeting 2003.