Yukio Okuda
发表
Yukio Okuda,
2002,
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).
Yukio Okuda,
Y. Okuda,
2007,
2007 IEEE International Test Conference.
Yukio Okuda,
2000,
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
Yukio Okuda,
Nobuyuki Furukawa,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Yukio Okuda,
Nobuyuki Furukawa,
2003
.
Yukio Okuda,
2004,
2004 International Conferce on Test.