F. Cerrina

x‐ray Lithography

F. Cerrina, 1999 .

X-ray photo-electron spectromicroscopy

F. Cerrina, 1995 .

Extreme ultraviolet and x-ray resist: Comparison study

F. Cerrina, H. Solak, F. Cerrina, 1999 .

Line edge roughness characterization using nanotubed-AFM and SEM

F. Cerrina, J. Shin, 2002, 2002 International Microprocesses and Nanotechnology Conference, 2002. Digest of Papers..

CHEMICAL AND BIOLOGICAL DIAGNOSTICS USING FULLY INSULATED ULTRACOMPLIANT THERMAL PROBES

F. Cerrina, Y. Gianchandani, F. Cerrina, 2002 .

Application of X-rays to nanolithography

F. Cerrina, 1997 .

Process dependence of roughness in a positive-tone chemically amplified resist

F. Cerrina, F. Cerrina, D. He, 1998 .