John M. Bird

Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.

John M. Bird, Rob Davies, Katherine Scott, 2009, 2009 IEEE Radiation Effects Data Workshop.

Neutron Induced Single Event Upset (SEU) Testing of Commercial Flash Memory Devices with and without Embedded Error Correction Codes (ECC)

John M. Bird, Mark Allenspach, Michael K. Peters, 2019, 2019 IEEE Radiation Effects Data Workshop.

Compendium of Total Ionizing Dose Radiation Test Results from Ball Aerospace & Technologies Corp.

John M. Bird, Rob Davies, Katherine Scott, 2009, 2009 IEEE Radiation Effects Data Workshop.

Stress analysis of a deeply eroded analog of the San Andreas fault : [semi-annual technical report]

John M. Bird, David L. Kohlstedt, 1980 .

Neutron induced single event upset (SEU) testing of commercial memory devices with embedded error correction codes (ECC)

John M. Bird, Michael K. Peters, Travis Z. Fullem, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Use of MACCS within ICI

Wendy A. Warr, George W. Adamson, John M. Bird, 1985, J. Chem. Inf. Comput. Sci..

Spectral mapping of Alaskan ophiolites using landsat thematic mapper data

John M. Bird, D. Harding, J. Bird, 1989 .