Wen-Kuan Yeh

Investigation of AlGaN/GaN HEMT Breakdown analysis with Source field plate length for High power applications

Arivazhagan L, Godfrey D, D Nirmal, 2020, 2020 5th International Conference on Devices, Circuits and Systems (ICDCS).

Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances

Wen-Kuan Yeh, J. S. Yuan, J. Ma, 2010, Microelectron. Reliab..