Seoung Bum Kim

Bootstrap-Based Multivariate Control Charts in Thin Film Transistor Liquid Crystal Display Manufacturing Processes

Kyu Jong Lee, Ji Hoon Kang, Jung Hwan Son, 2012 .

New Pattern Detection of Wafer Bin Map Using Deep-Learning

Chang Hyun Lee, Seoung Bum Kim, Seung Ho Baek, 2020 .

반도체 제조 가상계측 공정변수를 이용한 웨이퍼 수율 예측 / A Prediction of Wafer Yield Using Product Fabrication Virtual Metrology Process Parameters in Semiconductor Manufacturing

Wan Sik Nam, Seoung Bum Kim, S. Kim, 2015 .