Jiunn-Ren Hwang

Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices

Yiming Li, Fu-Liang Yang, Jiunn-Ren Hwang, 2006, IEEE Custom Integrated Circuits Conference 2006.

Discrete Dopant Fluctuated 20nm/15nm-Gate Planar CMOS

Shao-Ming Yu, Hung-Ming Chen, Fu-Liang Yang, 2007, 2007 IEEE Symposium on VLSI Technology.

Photoconductive sampling with an integrated source follower/amplifier

John F. Whitaker, Jiunn-Ren Hwang, J. Whitaker, 1996 .

Strained CMOS Devices With Shallow-Trench-Isolation Stress Buffer Layers

Shao-Ming Yu, Hung-Ming Chen, Fu-Liang Yang, 2008, IEEE Transactions on Electron Devices.

20nm gate bulk-finFET SONOS flash

Tang-Hsuan Chung, Chien-Chao Huang, Fu-Liang Yang, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Modulation bandwidth and noise limit of photoconductive gates

Jiunn-Ren Hwang, J. F. Whitaker, J. V. Rudd, 1996 .

Discrete Dopant Fluctuations in 20-nm/15-nm-Gate Planar CMOS

Shao-Ming Yu, Fu-Liang Yang, Yiming Li, 2008, IEEE Transactions on Electron Devices.