A. J. Strojwas

Test structures based VLSIC yield ramp maximization

A. J. Strojwas, D. Ciplickas, S. Lee, 2001, 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443).

Statistical Control of VLSl Fabrication Processes

P. K. Mozumder, A. J. Strojwas, 1990 .

METROPOLE-3D: An Efficient and Rigorous 3D Photolithography Simulator

Xiaolei Li, K. D. Lucas, A. J. Strojwas, 1999 .

Role of in-line defect sampling methodology in yield management

Ram Akella, R. K. Nurani, R. Wallace, 1995, Proceedings of International Symposium on Semiconductor Manufacturing.

Physically-based models of alignment schemes in commercial steppers

A. J. Strojwas, C.-M. Yuan, 1990, International Technical Digest on Electron Devices.

In-line defect sampling methodology in yield management: an integrated framework

Ram Akella, R. K. Nurani, A. J. Strojwas, 1996 .

Yield grows by X

K. Thumaty, A. J. Strojwas, N. Arora, 2005 .

Yield grows by X [IC routing architecture to reduce yield loss]

K. Thumaty, A. J. Strojwas, N. Arora, 2005 .