S.T. Zachariah

STEM: a framework for simulating and selecting I/sub DDQ/ measurement points for leakage faults

S. Chakravarty, S.T. Zachariah, P.J. Thadikaran, 1997, Digest of Papers IEEE International Workshop on IDDQ Testing.

Physical design trends and layout-based fault modeling

P. Dasgupta, B.B. Bhattacharya, S.T. Zachariah, 2004, 17th International Conference on VLSI Design. Proceedings..