Kazuhiro Sasada

Pixel Size for Mobile Applications

Masahiro Oda, Yoshihiro Okada, Sanyo Electric, 2005 .

The influence of SiN films on negative bias temperature instability and characteristics in MOSFET's

Y. Matsushita, K. Yodoshi, Atsuhiro Nishida, 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).