Yamin Zhang

GaN Schottky Diode Model for THz Multiplier Design with Consideration of Self-heating Effect

Shaobo Dun, Yuangang Wang, Xin Tan, 2019, 2019 IEEE 13th International Conference on ASIC (ASICON).

Notice of Violation of IEEE Publication PrinciplesNew architecture of low voltage sigma-delta ADC

Yanfeng Jiang, Wanrong Zhang, Jiaxin Ju, 2009, 2009 IEEE 8th International Conference on ASIC.

Assessment of pulse conditions effects on reliability in GaN-based high electron mobility transistors by transient temperature measurements

Shiwei Feng, Yamin Zhang, Hui Zhu, 2013 .

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

Shiwei Feng, Guangchen Zhang, Chunsheng Guo, 2014, IEEE Electron Device Letters.

Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs

Shiwei Feng, Chunsheng Guo, Xueqin Gong, 2014, IEEE Transactions on Device and Materials Reliability.

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

Shiwei Feng, Yamin Zhang, Bangbing Shi, 2018, IEEE Transactions on Power Electronics.