H.P. Wang
发表
F.H. Huang,
D.M. Lin,
H.P. Wang,
2005,
2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers.
Characterization of 90 nm SOI SRAM Single Cell Failure by Nano Probing Technique and TCAD Simulation
Y.T. Kim,
Y.M. Teo,
C.K. Leong,
2007,
2007 International Symposium on Integrated Circuits.
F.H. Huang,
D.M. Lin,
H.P. Wang,
2005,
2005 Quantum Electronics and Laser Science Conference.