M Eden

发表

Optimized acquisition parameters and statistical detection limit in quantitative EELS

T Pun, J R Ellis, M Eden, 1984, Journal of microscopy.

Elimination of baseline artifacts in spectra and their integrals

M Eden, D. I Hoult, D. Hoult, 1983 .

Optimal background estimation in EELS.

M Unser, J R Ellis, M Eden, 1987, Journal of microscopy.