F. Dietz

Analysis of the back gate effect on the breakdown behaviour of SOI LDMOS transistors

V. Dudek, S. Schwantes, T. Florian, 2004, Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).

Electrothermal simulation and measurements of SOI smart power transistors for short pulses

J. Teichmann, F. Dietz, G. Taschner, 2009, 2009 Proceedings of the European Solid State Device Research Conference.

A new leakage mechanism in SOI smart power technologies

A. Heid, V. Dudek, S. Schwantes, 2005, 2005 IEEE International SOI Conference Proceedings.

Analysis of the Back-Gate Effect on the On-State Breakdown Voltage of Smartpower SOI Devices

V. Dudek, S. Schwantes, M. Graf, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.