Daiki Hirabayashi
发表
Kiyomi Mori,
Toshiyuki Maeyama,
Daiki Hirabayashi,
2013
.
Shohei Shibuya,
Haruo Kobayashi,
Daiki Hirabayashi,
2015,
2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW).
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Haruo Kobayashi,
2012,
2012 Symposium on VLSI Circuits (VLSIC).
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Haruo Kobayashi,
2013,
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC).
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Haruo Kobayashi,
2012,
17th Asia and South Pacific Design Automation Conference.
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Nobukazu Takai,
2012,
2012 IEEE Asia Pacific Conference on Circuits and Systems.
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Haruo Kobayashi,
2015,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Design Methodology and Jitter Analysis of a Delay Line for High-Accuracy On-Chip Jitter Measurements
Kiichi Niitsu,
Nobukazu Takai,
Haruo Kobayashi,
2013
.
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Nobukazu Takai,
2013,
J. Electron. Test..
Kiichi Niitsu,
Haruo Kobayashi,
Osamu Kobayashi,
2014,
19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings.
Takahiro J. Yamaguchi,
Kiichi Niitsu,
Haruo Kobayashi,
2011,
2011 International SoC Design Conference.
Kiichi Niitsu,
Haruo Kobayashi,
Takahiro Yamaguchi,
2013
.
Haruo Kobayashi,
Kentaroh Katoh,
Daiki Hirabayashi,
2014,
19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings.
Kiichi Niitsu,
Nobukazu Takai,
Haruo Kobayashi,
2015
.
Kiichi Niitsu,
Haruo Kobayashi,
Takahiro Yamaguchi,
2013
.