Andrew C. Martin

Single-molecule microscopy using tunable nanoscale confinement

François Michaud, Christopher M. J. McFaul, Jason S. Leith, 2013, Optics & Photonics - NanoScience + Engineering.

Optical constants of SiO2 from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO2 on Eagle XG® glass by spectroscopic ellipsometry

Brian I. Johnson, Andrew C. Martin, Cody V. Cushman, 2017 .

Spectroscopic ellipsometry characterization of multilayer optical coatings

James N. Hilfiker, Ron A. Synowicki, Greg K. Pribil, 2018, Surface and Coatings Technology.

Measured optical constants of Pd77.5Cu6Si16.5 bulk metallic glass

Andrew C. Martin, J. Schroers, P. Bordeenithikasem, 2019, Optical Materials: X.

Optical properties of soda-lime float glass from spectroscopic ellipsometry

Andrew C. Martin, R. Synowicki, B. Johs, 2011 .

Eagle XG® glass, optical constants from 230 to 1690 nm (0.73 - 5.39 eV) by spectroscopic ellipsometry

Andrew C. Martin, Cody V. Cushman, M. Linford, 2016 .

Spectroscopic ellipsometry for anisotropic nano-layered Al/SiO2 metamaterial with hyperbolic dispersion

Priscilla Kelly, Lyuba Kuznetsova, Andrew C. Martin, 2016, NanoScience + Engineering.

Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis

Andrew C. Martin, J. Hilfiker, T. Tiwald, 2020 .