A. V. Yanenko

Automatic test complex for parametric control of power NMOS and PMOS transistors

L. N. Kessarinskiy, N. E. Aristova, A. S. Tararaksin, 2015, 2015 International Siberian Conference on Control and Communications (SIBCON).

The prediction for single event latchup sensitivity parameters of digital CMOS ICs based on its technological features

D. V. Bobrovsky, A. V. Yanenko, A. E. Rudenkov, 2017, 2017 IEEE 30th International Conference on Microelectronics (MIEL).

Local Laser Irradiation Technique for Estimating Single Event Effects Sensitivity

A. N. Egorov, O. B. Mavritsky, A. V. Yanenko, 2022 .

Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination

A. S. Tararaksin, A. V. Yanenko, A. I. Chumakov, 2012 .

Simulating single-event effects associated with high-energy neutrons for different VLSI technologies

S. V. Baranov, P. N. Osipenko, A. V. Yanenko, 2008 .

Estimating IC susceptibility to single-event latchup

A. N. Egorov, S. V. Baranov, O. B. Mavritsky, 2008 .

SEL and cell failures in MRAM under ion and focused laser irradiation

A. V. Yanenko, A. B. Boruzdina, A. Pechenkin, 2017, 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Radiation and postirradiation functional upsets in CMOS SRAM

A. V. Yanenko, A. Chumakov, 1996 .