Anton O. Balbekov

On board electronic devices safety provided by DICE-based Muller C-elements

Igor A. Danilov, Maxim S. Gorbunov, Alexandra I. Shnaider, 2018, Acta Astronautica.

Application of the layout-aware single event simulations to a design of 65 nm memory units

Anton O. Balbekov, 2018, 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT).

Circuit-Level Layout-Aware Modeling of Single-Event Effects in 65-nm CMOS ICs

Anton O. Balbekov, Maxim S. Gorbunov, Gennady I. Zebrev, 2018, IEEE Transactions on Nuclear Science.

DICE-based muller C-elements for soft error tolerant asynchronous ICs

Maxim S. Gorbunov, Alexandra I. Shnaider, Anton O. Balbekov, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Layout-aware Soft Error Rate Estimation Technique for Integrated Circuits under the Environment with Energetic Charged Particles

Maxim S. Gorbunov, Anton O. Balbekov, S. G. Bobkov, 2017 .

Layout-aware simulation of soft errors in sub-100 nm integrated circuits

Anton O. Balbekov, M. S. Gorbunov, S. G. Bobkov, 2016, International Conference on Micro- and Nano-Electronics.