S. Burgniard

Two‐dimensional modelling and characterization of gate‐to‐drain overlap contribution on the leakage current of a MOSFET, used as a GCD

R. Jérisian, E. Ciantar, S. Burgniard, 1993 .

Hot-carrier effects on leakage currents in MOSFETs—Modelling and experiment

R. Jérisian, E. Ciantar, S. Burgniard, 1993 .